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Hitachi H-800 200 kV transmission electron microscope
(TEM) operated by graduate student Ben Simkin. This instrument,
which is used for imaging the structure of metals, ceramics, polymers,
and electronic materials at magnifications up to 300,000X is introduced
in MSE 375 and used extensively in MSE 870.
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James Corgan using a Scintag x-ray diffractometer
for his MSE 451 project. This instrument is used in many studies
for determining the structures of materials.
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Rockwell hardness testing, being carried out by
Amy Gray and Brian Bratney, is used to assess the properties of
materials in many courses including MSE 250, MSE 375, MSE 376, MSE
466 and MSE 499 Senior Research Projects.
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A R.J. Lee Personal scanning electron microscope
(SEM), being used by Amy Gray, is sited in the department's undergraduate
material laboratory. This instrument, equipped with energy dispersive
x-ray spectroscopy (EDS) capabilities for chemical analysis, is
dedicated to undergraduate student use. Students in many courses,
including MSE 250, MSE 375, MSE 376, and MSE 466 make extensive
use of the instrument.
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The department's undergraduate lab has recently
upgraded its optical microscopes, including digital image capture
facilities. Here, Catherine Silwinski uses a Nikon Eclipse transmission/reflection
microscope to study her failed component for her MSE 466 project.
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Adwait Telang loads a sample in to an Instron mechanical
test frame. This computer controlled system is used by both undergraduate
and graduate students for testing the mechanical properties of materials.
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