Professor M.A. Crimp
3513 EB, 355-0294

Office Hours:

Mon, Wed, Thurs, 10-11
Other times by appointment

Course outline:

The course will be divided into 5 general subjects with a duration of approximately 3 weeks devoted to each. During the 3 weeks, there will be lectures and demonstrations. The final class session for each subject will encompass a discussion session and quiz. Also, a written summary of the technique and demonstrations will be due at each of these final sessions. It is expected that these written summaries will be 2-4 pages in length (single spaced). The sessions will be scheduled as followed:

Diffraction techniques using SEM
STEM and XEDS
EELS
CBED
HREM

Grading:

Written summaries............. 50% (10% each)
Quizzes........................... 50% (10% each)

Texts:

There is no required text as the course covers many different topics. However, a limited list of useful text are listed below:

J.I. Goldstein and H. Yakowitz, Practical Scanning Electron Microscopy, Plenum Press, NY, 1975, ISBN 0-306-30820-7.

D.B. Williams, Practical Analytical Electron Microscopy in Materials Science, Philips Optics Publishing Group, New Jersey, 1984, ISBN 0-9612934-0-3.

S.L. Flegler, J.W. Heckman and K.L. Klomparens, Scanning and Transmission Electron Microscopy; an Introduction, Freeman and Company, NY, 1993, ISBN 0-716707147-4.

J.C. Spence, Experimental High-Resolution Electron Microscopy, Oxford University Press, NY, 1988, ISBN 0-19-505405.

P. Buseck, J. Cowley and L. Eyring, High Resolution Transmission Electron Microscopy and Associated Techniques, Oxford University Press, NY, 1988, ISBN 0-19-504275-1.

M.H. Loretto, Electron Beam Analysis of Materials, Chapman and Hall, NY, 1984, ISBN 0-412023390-8; ISBN 0-412-23400-9.

K. Rajan, Intermediate Voltage Microscopy and its Application to Materials Science, Philips Electron Optics Pub. Group, 1987.

B.E.P. Beeston, R.W. Horne and R. Markham, Electron Diffraction and Optical Diffraction Techniques, North-Holland/American Elsevier, 1972, ISBN 0-7204-4253-2.

A.W. Agar, R.H. Alderson, D. Chescoe, Principles and Practice of Electron Microscope Operation, North-Holland/American Elsevier, 1972, ISBN 0-7204-4255-9.

M. Von Heimendahl, Electron Microscopy of Materials: An Introduction, Academic Press, 1980, ISBN 0-12-725150-2.

J.W. Edington, Practical Electron Microscopy in Materials Science, Phillips, 1974.

Thomas and Goringe, Transmission Electron Microscopy of Materials, J. Wiley Publishing, 1979, ISBN 0-471-12244-0. Reprinted by TechBooks.

Hirsch, Howie, Nicholson, Pashley and Whelan, Electron Microscopy of Thin Crystals, Krieger Publishing, 1965, 1977, ISBN 0-88275-376-2.