MSU Deptartment of Chemical Engineering & Materials Science
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Analytical Characterization Facilities: Hitachi S2500C Scanning Electron Microscope

Hitachi S2500C Scanning Electron Microscope with Oxford ISIS EDS Analyzer

 

Instrument Features

LaB6 source with secondary electron resolution of 5.0 nm at 25 kV.

 
Secondary electron image of a gas atomized FeAl powder.

 

Energy dispersive x-ray spectroscopy (EDS) with Be window, thin window, and window-less configurations for light element analysis.

 

 

Secondary electron image of a 6000 series Al alloy showing extensive stringers.

 

 

 

 

 

 

EDS shows the stringers are rich in Fe, Cr, and Cu.

 

EDS x-ray mapping

Secondary electron image of a fractured Al alloy and Fe x-ray map showing the presence of iron rich particles on the fracture surface.

 

 
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