MSU Deptartment of Chemical Engineering & Materials Science
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Analytical Characterization Facilities: Hitachi H-800 Transmission Electron Microscope

Hitachi H-800 Transmission Electron Microscope with GATAN 673 Mark 3 Wide Angle TV System

 

Instrument Features

Diffraction contrast brightfield TEM with 0.3 nm resolution

 
Brightfield TEM image of a giant magnetoresistance spin valve multilayer.

 

Darkfield/weak-beam diffraction contrast imaging

Weak-beam darkfield image of dislocations in Fe-40at% Al showing superpartial dislocation pairs.

 

Selected area diffraction

 
Brightfield image and associated selected area diffraction pattern from a NiTl shape memory alloy thin film.

 

Specimen stages

Single tilt, double tile, in-situ straining and heating stages are available.

See dislocations moving during in-situ straining in NiAl, http://www.egr.msu.edu/~crimp/movies/index.html

 
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