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CamScan 44FE Field
Emission Gun Scanning Electron Microscope
Uniquely configured to carry out a wide
range of materials studies including crystallographic
analysis ussing ECCI, SACP, and EBSD. |
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ECCI image of dislocations
along a crack edge in a 4-point bend specimen of NiAl. |
Instrument Features
Secondary electron resolution of 2.5
nm at 25 kV and 5.0 nm at 5 kV
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Secondary electron image
of a fracture surface of Fe-50at% Al. |
Backscattered electron resolution of 5.0 nm at 25
kV
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Backscattered electron
image showing channeling contrast from twins in TiAl. |
Oversize chamber with fully motorized
stage for automated data collection. Specimens as
large as 3 kg can be observed with a stage x-and-y
travel of 100 mm X 100 mm. In-situ mechanical testing
using tensile, bending, and fatigue stages.
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The oversize chamber accomadates
large specimens and a vareity of in-situ stages. |
Selected area channeling pattern capabilities
(SACP) with a spatial resolution of 3 micrometers.
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Selected area channeling
pattern from TiAl reveals superlattice line details. |
Electron back scattered diffraction/orientation
imaging microscopy (EBSD/OIM) capabilities using a
CamScan Ortex camera and HKL Technologies Channel
Software. System allows both beam and stage scanning
control.
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EBSD orientation map shows
crystal rotation and dislocation slip band at grain
boundary in gamma-TiAl. |
